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Scope

Scan Control app is provided for independent and open control of point electronic GmbH scan controllers, including REVOLON for TEM and DISS6 for SEM. I can be used over both TCP/IP and USB device connections.

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Intended Use

Scan Control app is aimed for users wishing to access advanced scan settings not available in the usual integrated microscope control software. Key features include

  • Predefined Image scan modes for normal sawtooth, sub-scans, wobble and chopped patterns, including flyback control
  • Free Pixel maps scan modes with open XY coordinates, variable speeds and beam blanker control
  • Trigger and synchronization settings for fast 4D STEM cameras and beam blankers
  • Live scan transformations for rotation, tilt and skew
  • Multimodal quantitative acquisition of simultaneous detector signals
  • Gapless time-lapse acquisition for in-situ microscopy
  • Physical pixel size information with automatic TEM communication over EMGateway
  • Full screen, zoom, auto-range and color LUT views
  • File save to multipage TIFF with embedded XMP metadata

Scan Control is not intended for routine capture of images, for example routine simplified microscopy workflow. For a simple integrated and easy to learn user interface, please see the DISS6 software.

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