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REVOLON is an external scan controller for Transmission Electron Microscopes (TEM). It's designed and equipped specifically for TEM, for example hardware compatibility with all TEM modes, free device control over its API with Python scripting and software with open access to advanced scan function, including arbitrary scans and triggers. 

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REVOLON available in several models with/without additional analog amplification for the 5 MHz inputs on the front panel. Back panel is the same for all models.

    REVOLON 4 (default), REVOLON 8 and REVOLON 16 with additional amplification, where digits indicate the number of available inputs on the front panel. REVOLON CORE without additional amplification and with 16 direct inputs on the front panel

    Additional amplification provides compatibility with a wider range of analog signals.

    REVOLON may be connected directly to the TEM or it may be daisy-chained with other external scan controllers. 

    Intended use

    REVOLON scan controller has multiple uses

      deflect/scan the electron beam: it generates X and Y scan voltages for the TEM scan amplifier, which transforms them to currents for TEM scan and de-scan coils, which then give the necessary beam tilts/phase shifts to direct the electron beam. generate sawtooth image scans: standard image scan are generated on-board, including sub-pixel scans, with the necessary flyback corrections for scan coil hysteresis. execute free arbitrary scans: can also be loaded with a list of X and Y coordinates and triggers, from the software, to freely generate any scan pattern, for example serpentine or checked board. acquire analog signals: it digitises analog signals connected from TEM analog detectors, for example Bright Field (DF), Annular Dark Field (ADF), or highly-segmented STEM detectors, and supplies acquired values live as data streams.
      acquire digital signals: it counts pulses received at the digital inputs, for example from single electron processing units, or X-Rays, and supplies acquired counts live as data streams. trigger fast detectors: it generates a range of TTL triggers for acquisition of new frames with a fast camera, or give new time stamps for single particle detectors. Both master/trigger and slave/synchronisation configurations are supported. control fast beam blankers: it generates the TTL trigger to open/close fast beam blank during flyback and between scans. Blanking on individual scan points is manually controller in PixelMap arbitrary scan mode.  control holder electronics: for Electrical Analysis with biasing holders, including communication with the embedded routing and biasing, also including digitization of preamplifier signal with digital gain and offsets. digital lock in amplification: with a fast beam blanker or beam deflection (up to the frequency allowed by scan coils), including digital gain and offset.

      Normal operation of the TEM is not disturbed, as external scan controllers use the TEM external scan interface for third parties, same as EDX or EELS. Where supported by the TEM, REVOLON can also auto switch the microscope to external scan.


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